Description
iKon-L SO – High Energy Detection
Andor’s iKon-L SO is a revolutionary large area CCD platform, offering back illuminated (> 90% QE) full frame sensors up to 4MPixel(2k x 2k), 1 MHz readoutand unparalleled priority TE cooling down to –100°C.
Andor’s iKon series offers outstanding sensitivity performance through a combination of > 95% QE back-illuminated sensors, low noise readout electronics and industry-leading, maintenance-free deep TE-cooling down to -100°C. It features high resolution 1 and 4.2 Megapixel large area sensor options (with 13 and 13.5 µm pixels respectively) for simultaneous high dynamic range and high spatial resolution imaging in the VUV and soft x-ray range.
A convenient 16-point, knife-edge sealed 6” rotatable CF-152 flange provides a robust and highlyeffective seal to any compatible vacuum chamber interface. The iKon-M and -L also offer a USB2 interface and Labview or EPICS compatibility for seamless integration into complex setups.
Applications
- VUV/EUV/XUV Imaging
- X-Ray Imaging & Microscopy
- X-Ray Diffraction (XRD)
- X-Ray Plasma Imaging
- X-Ray source characterization
- X-Ray Phase Contrast Imaging
- High Harmonic Generation (HHG)
Spécifications clés
- 1 MP or large area 4.2 MP sensors
- Peak QE up to 95% (soft x-ray region)
- High resolution 13 or 13.5 µm pixels
- TE-cooling down to -100°C
- Readout noise as low as 2.9 eLabview and EPICS compatibility
- USB 2.0 Interface
